Titanium nitride removal
AssigneeApplied Mateials, Inc.
InventorsXikun Wang, Mandar Pandit, Anchuan Wang, Nitin K. Ingle
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AssigneeApplied Mateials, Inc.
InventorsXikun Wang, Mandar Pandit, Anchuan Wang, Nitin K. Ingle
Estimating the term…
A method of removing titanium nitride hardmask is described. The hardmask resides above a low-k dielectric layer prior to removal and the low-k dielectric layer retains a relatively low net dielectric constant after the removal process. The low-k dielectric layer may be part of a dual damascene structure having copper at the bottom of the vias. A non-porous carbon layer is deposited prior to the titanium nitride hardmask removal to protect the low-k dielectric layer and the copper. The titanium nitride hardmask and the non-porous carbon layer are removed with a gas-phase etch using plasma effluents formed in a remote plasma from a chlorine-containing precursor. Plasma effluents within the remote plasma are flowed into a substrate processing region where the plasma effluents react with the non-porous carbon layer and the titanium nitride.
A method of removing titanium nitride hardmasks, the method comprising:
Dependencies are inferred from the claim text.