Noise parameter extraction method

A method for extracting the four noise parameters of low noise transistors over a broad frequency band uses, at each frequency inside said band, noise figure data F(Γs.i) measured for a multitude of at least 7 source reflection factor points Γs.i, with i≧7, randomly distributed over the source Smith chart;

• whereby, at each frequency inside said band, each said noise parameter is extracted using noise figure F(Γs.i) data measured under different sets of source reflection factors as follows:
• a) identify the smallest measured noise figure Fo and associated source reflection factor Γs.o;
• b) use noise figure data F(Γs.i) measured for reflection factors Γs.i included in a cluster of points with a radius of approximately 0.2 reflection factor units, in proximity and surrounding Γs.o, to extract noise parameters with emphasis on minimum noise figure (Fmin) and optimum source reflection factor Γopt;
• c) identify a set of noise figure data points measured for reflection factors Γs.j included in a cluster of points with a radius of approximately 0.1 and being placed approximately anti-diametric to Γopt with respect to the center of the Smith chart;
• d) extract noise parameters using data points used in steps a) and c) with emphasis on equivalent noise resistance (Rn);
• e) save noise parameter data for Fmin and Γopt extracted in step b) and Rn in step d).