Methods, devices, and systems for forming atomically precise structures

A system for forming atomically precise structures on a sample, the system comprising:

• a scanning tunneling microscope having a tip;
• a motion control system configured to precisely control movement of the tip of the scanning tunneling microscope relative to a sample;
• and
• a processing system in communication with the scanning tunneling microscope and the motion control system, wherein the processing system is configured to:
• identify features of the sample based on images of the sample obtained by the scanning tunneling microscope such that the identified features of the sample are utilized by the motion control system to guide movement of the tip of the scanning tunneling microscope relative to the sample;
• and
• control application of a bias voltage between the tip of the scanning tunneling microscope and a surface of the sample to pattern the surface of the sample;
• wherein the sample is a crystal and further comprising defining a pixel grid corresponding to the crystal sample based on the identified features of the crystal sample, wherein the pixel grid is utilized to guide movement of the tip of the scanning tunneling microscope relative to the surface of the crystal sample;
• wherein a pixel of the pixel grid is defined by a periodic grouping of atoms or molecules of the crystal sample;
• wherein the pixels are identified by performing at least one of:
• searching for a peak in the absolute value of a Fourier Transform nearest an expected frequency of the periodic grouping of the atoms or molecules;
• comparing an STM image of the crystal sample with a three-dimensional model of the crystal sample and aligning the three-dimensional model to the STM image, wherein the three-dimensional model is based on a lattice structure of the crystal sample defined by the periodic grouping of the atoms or molecules;
• or
• a combination of (a) searching for a peak in the absolute value of a Fourier Transform nearest an expected frequency of the periodic grouping of the atoms or molecules and (b) comparing an STM image of the crystal sample with a three-dimensional model of the crystal sample and aligning the three-dimensional model to the STM image, wherein the three-dimensional model is based on a lattice structure of the crystal sample defined by the periodic grouping of the atoms or molecules.