Methods for reducing path loss while testing wireless electronic devices with multiple antennas
AssigneeApple Inc.
InventorsJoshua G. Nickel, Mattia Pascolini, Jr-Yi Shen
Life of this patent
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AssigneeApple Inc.
InventorsJoshua G. Nickel, Mattia Pascolini, Jr-Yi Shen
Estimating the term…
A test station may include a test host, a test unit, and a test enclosure. A device under test (DUT) having at least first and second antennas may be placed in the test enclosure during production testing. Radio-frequency test signals may be conveyed from the test unit to the DUT using a test antenna in the test enclosure. In a first time period during which the performance of the first antenna is being tested, the DUT may be oriented in a first position such that path loss between the first antenna and the test antenna is minimized. In a second time period during which the performance of the second antenna is being tested, the DUT may be oriented in a second position such that path loss between the second antenna and the test antenna is minimized. The DUT is marked as a passing DUT if gathered test data is satisfactory.
A method for using a test station to test a production device under test that includes at least first and second antenna structures, wherein the first and second antenna structures are formed on opposing sides of the production device under test, and wherein the test station includes a test enclosure, the method comprising:
A method for using a test station to test a device under test that includes at least first and second antenna structures, wherein the test station includes a test enclosure and a test antenna within the test enclosure, the method comprising:
A method for using a test station to test a device under test that includes at least first and second antenna structures, wherein the test station includes a test enclosure and a near field communications element within the test enclosure, the method comprising:
Dependencies are inferred from the claim text.