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US 9,318,459 B2Granted
Through via package
AssigneeStmicroelectronics Pte Ltd
InventorsHow Yuan Hwang, Kah Wee Gan
Life of this patent
Estimating the term…
Abstract
An integrated circuit package includes an integrated circuit die in a reconstituted substrate. The active side is processed then covered in molding compound while the inactive side is processed. The molding compound on the active side is then partially removed and solder balls are placed on the active side.
Claims12
A device, comprising:
- an integrated circuit die having an active side and an inactive side;
- electrical contacts on an active side of the integrated circuit die;
- first conductive redistribution lines overlying the active side of the die and coupled to the respective electrical contacts;
- second conductive redistribution lines overlying the inactive side of the die;
- a plurality of through vias, each through via electrically coupling a respective first conductive redistribution line to a respective second redistribution line;
- first solder balls coupled to the first conductive redistribution lines;
- a first encapsulation layer on the first metal redistribution lines and encapsulating sides surfaces of the first solder balls, the first encapsulation layer and the first solder balls having a planar surface;
- second solder balls on the first solder balls, the second solder balls extending beyond the planar surface of the first encapsulation layer and the first solder balls;
- third solder balls on the second conductive redistribution lines;
- a second encapsulation layer over the second conductive redistribution lines and encapsulating the third solder balls, the second encapsulation layer and the third solder balls having a planar surface;
- and
- fourth solder balls on the third solder balls, the fourth solder balls extending beyond the planar surface of the second encapsulation layer and the third solder balls.
9 more elements
A device, comprising:
- a reconstituted die having a first surface and a second, opposite surface, the reconstituted die including:
- a semiconductor die having an active side forming a first portion of the first surface of the reconstituted die and an inactive side, the semiconductor die including electrical contacts on the active side;
- and
- a plurality of through vias extending from the first surface to the second surface;
- first conductive redistribution lines overlying the first surface of the reconstituted die and coupled to the electrical contacts, respectively;
- second conductive redistribution lines overlying the second surface of the reconstituted die;
- first solder balls coupled to the first conductive redistribution lines, the first solder balls having a planar surface;
- a first encapsulation layer on the first metal redistribution lines encapsulating the first solder balls, the first encapsulation layer having a surface that is coplanar with the planar surface of the first solder balls;
- second solder balls on the first solder balls, the second solder balls extending beyond the surface of the first encapsulation layer;
- third solder balls on the second conductive redistribution lines, the third solder balls having planar surfaces;
- a second encapsulation layer over the second conductive redistribution lines and having a surface that is coplanar with the planar surfaces of the third solder balls;
- and
- fourth solder balls on the third solder balls, the fourth solder balls extending beyond the surface of the second encapsulation layer.
10 more elements
Dependencies are inferred from the claim text.