Method to control space charge in a mass spectrometer
AssigneeDH Technologies Development Pte. Ltd.
InventorMircea Guna
Life of this patent
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Abstract
A method for operating a mass spectrometer having an ion trap over a plurality of selected mass-to-charge ranges constituting an overall mass-to-charge range is disclosed. For each of the plurality of selected mass-to-charge ranges the method comprises filling the ion trap with fragmented ions of the selected mass-to-charge ranges, cooling the fragmented ions trapped in the ion trap for a first cooling period, applying an RF voltage and a resolving direct current voltage to the ion trap for eliminating any remaining fragmented ions outside the selected ion mass-to-charge range and retaining ions within the selected ion mass-to-charge range, cooling the retained ions in the ion trap for a second cooling period, and scanning the retained ions out of the ion trap and detecting the ions released therefrom.
Claims8
A method for operating a mass spectrometer for a plurality of selected mass-to-charge ranges, the mass spectrometer having an ion trap, the plurality of selected mass-to-charge ranges constituting an overall mass-to-charge range, for each of the plurality of selected mass-to-charge ranges the method comprising:
- filling the ion trap with fragmented ions of the selected mass-to-charge ranges;
- cooling the fragmented ions trapped in the ion trap for a first cooling period;
- applying an RF voltage and a resolving direct current voltage to the ion trap for eliminating any remaining fragmented ions outside the selected ion mass-to-charge range and retaining ions within the selected ion mass-to-charge range;
- cooling the retained ions in the ion trap for a second cooling period;
- and
- scanning the retained ions out of the ion trap and detecting the ions released therefrom.
Dependencies are inferred from the claim text.