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US 9,318,221 B2Granted
Memory device with secure test mode
AssigneeWinbound Electronics Corp.
InventorsNir Tasher, Uri Kaluzhny, Tsachi Weiser, Valery Teper
Life of this patent
Estimating the term…
Abstract
A method in a memory device that operates in a testing mode, includes receiving a vector to be written to the memory device. The vector is written to the memory device only if the vector belongs to a predefined set of test vectors. If the vector does not belong to the set of test vectors, the vector is converted to one of the test vectors, and the converted vector is written to the memory device.
Claims14
A method, comprising:
- in a memory device operating in a testing mode, receiving a vector to be written to the memory device;
- writing the vector to the memory device only if the vector belongs to a predefined set of test vectors;
- and
- if the vector does not belong to the set of test vectors, converting the vector to one of the test vectors by selecting a subset of bits of the vector and replacing remaining bits of the vector with periodic replications of the selected subset, and writing the converted vector to the memory device.
1 more element
A memory device, comprising:
- a memory;
- and
- a memory controller, which configured to operate in a testing mode, to receive a vector to be written to the memory, to write the vector to the memory only if the vector belongs to a predefined set of test vectors, and, if the vector does not belong to the set of test vectors, to convert the vector to one of the test vectors by selecting a subset of bits of the vector and replacing remaining bits of the vector with periodic replications of the selected subset, and to write the converted vector to the memory.
Dependencies are inferred from the claim text.