Lithographic apparatus and device manufacturing method
AssigneeASML Netherlands B.V.
InventorsErwin John Van Zwet, Pieter Willem Herman De Jager, Johannes Onvlee, Hendrik De Man
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AssigneeASML Netherlands B.V.
InventorsErwin John Van Zwet, Pieter Willem Herman De Jager, Johannes Onvlee, Hendrik De Man
Estimating the term…
A system to control the focus of a mask-less lithographic apparatus, the apparatus including a projection system to project an image of a programmable patterning device onto a substrate. A first actuator system is configured to move at least one of the lenses of the projection system in a direction perpendicular to the optical axis of the projection system. A radiation beam expander is configured to project an image of the programmable patterning device onto the at least one lens. A second actuator system is configured to move the radiation beam expander in a direction parallel to the optical axis of the projection system in order to control the focus of the image projected onto the substrate.
A lithographic apparatus having at least one optical column, the optical column comprising:
A device manufacturing method, comprising:
Dependencies are inferred from the claim text.