Process and system for calibrating a first loop feature value estimation method using a first locally measurable loop characteristic and a first set of parameters

System for calibrating a first loop feature value estimation method using a first locally measurable loop characteristic and a first set of parameters, comprising:

• a first measurement device for measuring a first locally measurable physical characteristic;
• a first loop feature value estimation processor, operatively connected to said first measurement device and to a first parameter memory, said first loop feature value estimation processor being adapted to produce a first loop feature value estimate by means of a first loop feature value estimation method on the basis of said first measurable physical characteristic and a first parameter set contained in said first parameter memory;
• a second measurement device for measuring a second locally measurable physical characteristic;
• a second loop feature value estimation processor, operatively connected to said second measurement device and to a second parameter memory, said second loop feature value estimation processor being adapted to produce a second loop feature value estimate by means of a second loop feature value estimation method on the basis of said second measurable physical characteristic and a second parameter set contained in said second parameter memory, the first loop feature value estimation method and the second loop feature value estimation method being different methods;
• and
• means for using said first loop feature value estimate and said second loop feature value estimate to update said first parameter set such that loop feature value estimates subsequently obtained by said first loop feature value estimation processor substantially coincide with loop feature value estimates obtained by said second loop feature value estimation processor.