Probe card of low power loss
AssigneeMpi Corporation
InventorsWei-Cheng Ku, Jun-Liang Lai
Life of this patent
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Abstract
A probe card, which is used to transmit power signals and test signals from a tester to a DUT, includes a pin base, a plurality of signal pins, a signal conducting circuit and at least one power conducting circuit. The signal pins are made of conductive materials, and each contacts the DUT with an end thereof; the signal conducting circuit has a first resistance, and electrically connects the tester and the other end of one of the signal pin to transmit the test signals to the DUT; the power conducting circuit has a second resistance which is much less than the first resistance, and electrically connects the tester and the other end of one of the signal pin which is not connected with the signal conducting circuit to transmit the power signals to the DUT.
Claims16
A probe card for transmitting power signals and test signals from a tester to a device under test (DUT), wherein the tester provides power to the DUT via the power signals, and the DUT is tested with the test signals, the probe card comprising:
- a plurality of signal pins made of conductive materials, wherein each signal pin has two ends, and one of the two ends thereof contacts the DUT;
- at least one signal conducting circuit having a first resistance, wherein each signal conducting circuit electrically connects the tester and the other end of one of the signal pins, and each signal conducting circuit transmits the test signals to the DUT;
- and
- at least one power conducting circuit having a second resistance which is much less than the first resistance, wherein each power conducting circuit electrically connects the tester and the other end of one of the signal pins which is not connected with the signal conducting circuit, and each power conducting circuit transmits the power signals to the DUT.
Dependencies are inferred from the claim text.