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AssigneesKyushu Institute of Technology, National University Corporation Nara Institute of Science and Technology, Tokyo Metropolitan University
InventorsYasuo Sato, Seiji Kajihara, Michiko Inoue, Tomokazu Yoneda, Hyunbean Yi, Yukiya Miura
Estimating the term…
A semiconductor device and the like that can determine the performance of a semiconductor integrated circuit with higher accuracy even when test environment fluctuates. The semiconductor device detects degradation of the semiconductor integrated circuit, including measurement unit that measures temperature and voltage, decision unit that judges whether the test is executed within an allowable test timing in the detection target circuit portion at each test operation frequency and decides a maximum test operation frequency and calculation unit that converts a maximum test operation frequency into that at a standard temperature and voltage and calculates a degradation amount. The semiconductor integrated circuit has a monitor block circuit that monitors the values for the measurement unit to measure temperature and voltage. The measurement unit has estimation unit that estimates temperature and voltage of a detection target circuit portion based on the monitored values. The calculation unit uses the estimated temperature and voltage.
A semiconductor device for detecting degradation which occurs in a semiconductor integrated circuit having a detection target circuit portion where a test is executed, comprising:
A semiconductor device for detecting variability which occurs in pluralities of same kinds of semiconductor integrated circuits where a test is executed, comprising:
A detection method for detecting degradation which occurs in a semiconductor integrated circuit or variability which occurs in pluralities of same kinds of semiconductor integrated circuits,
Dependencies are inferred from the claim text.