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US 9,316,670 B2Granted
Multiple contact probes
AssigneeFormFactor, Inc.
InventorJanuary Kister
Life of this patent
Estimating the term…
Abstract
The present invention is a probe array for testing an electrical device under test comprising one or more ground/power probes and one or more signal probes and optionally a gas flow apparatus.
Claims10
A probe array for probing a device under test having a plurality of contact pads comprising:
- at least one power/ground probe wherein said power/ground probe comprises at least two skates;
- at least one signal probe;
- said power/ground probe comprising a width that is greater than a width of said signal probe.
Dependencies are inferred from the claim text.