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US 9,316,669 B2Granted
Measurement probe providing different levels of amplification for signals of different magnitude
AssigneeKeysight Technologies, Inc.
InventorsMichael T. McTigue, Kenneth W. Johnson, Edward Vernon Brush, IV
Life of this patent
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Abstract
A measurement probe comprises at least one input port configured to receive an input signal generated in relation to a device under test (DUT), and an amplification unit configured to amplify the input signal with a first gain where the input signal has a first amplitude, and further configured to amplify the input signal with a second gain lower than the first gain where the input signal has a second amplitude greater than the first amplitude.
Claims21
A measurement probe, comprising:
- at least one input port configured to receive an input signal generated in relation to a device under test (DUT);
- and
- an amplification unit configured to amplify the input signal with a first gain where the input signal has a first amplitude, and further configured to amplify the input signal with a second gain lower than the first gain where the input signal has a second amplitude greater than the first amplitude.
A method of operating a measurement probe, comprising:
- receiving an input signal generated in relation to a device under test (DUT);
- amplifying the input signal with a first gain where the input signal has a first amplitude, the amplifying the input signal with the first gain comprising amplifying the input signal with first and second amplifiers arranged in parallel, wherein the first amplifier amplifies the input signal with the first gain to produce a first amplified input signal, and the second amplifier amplifies the input signal with the second gain to produce a second amplified input signal;
- amplifying the input signal with a second gain lower than the first gain where the input signal has a second amplitude greater than the first amplitude;
- and
- clamping the first amplified input signal between an upper clamping threshold and a lower clamping threshold.
2 more elements
A measurement probe, comprising:
- at least one input port configured to receive an input signal generated in relation to a device under test (DUT);
- and
- an amplification unit configured to amplify the input signal with a first gain where the input signal has a first amplitude, and further configured to amplify the input signal with a second gain lower than the first gain where the input signal has a second amplitude greater than the first amplitude, the amplification unit comprising:
- a first amplifier configured to receive the input signal through a first signal path, amplify the input signal with the first gain to produce a first amplified input signal, and transmit the first amplified input signal to a first output port;
- and a second amplifier configured to receive the input signal through a second signal path, amplify the input signal with the second gain to produce a second amplified input signal, and transmit the second amplified input signal to a second output port;
- and
- a clamping circuit disposed in the second signal path between the second amplifier and the second output port and configured to clamp the second amplified input signal between an upper clamping threshold and a lower clamping threshold.
4 more elements
Dependencies are inferred from the claim text.