Semiconductor light emitting device, semiconductor wafer with first and second portions with different lattice polarities
AssigneeKabushiki Kaisha Toshiba
InventorsJongil Hwang, Rei Hashimoto, Shinji Saito, Shinya Nunoue
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Abstract
According to one embodiment, a semiconductor light emitting device includes a light emitting layer and a first semiconductor layer. The first semiconductor layer is arranged with the light emitting layer in a first direction. The first semiconductor layer includes a first portion and a second portion. The first portion and a second portion include a nitride semiconductor. The first portion has a first lattice polarity. The second portion has a second lattice polarity different from the first lattice polarity.
Claims15
A semiconductor light emitting device, comprising:
- a light emitting layer;
- a first semiconductor layer arranged with the light emitting layer in a first direction, the first semiconductor layer including a first portion and a second portion, the first portion and the second portion including a nitride semiconductor, the first portion having a first lattice polarity, and the second portion having a second lattice polarity different from the first lattice polarity;
- a second semiconductor layer provided between the first semiconductor layer and the light emitting layer, the second semiconductor layer being of a first conductivity type;
- a third semiconductor layer of the second conductivity type, the light emitting layer being provided between the second semiconductor layer and the third semiconductor layer;
- and
- an In-containing layer provided between the second semiconductor layer and the light emitting layer, the In-containing layer including a nitride semiconductor including In,
- the light emitting layer including a nitride semiconductor including In,
- a composition ratio of In in the In-containing layer being different from a composition ratio of In in the light emitting layer,
- a lattice length of the In-containing layer in an a-axis direction being not less than 0.1% greater than a lattice length of the second semiconductor layer in the a-axis direction, and
- a difference of the lattice length of the In-containing layer in the a-axis direction and the lattice length of the light emitting layer in the a-axis direction is not more than 0.1%.
A semiconductor wafer, comprising:
- a substrate;
- a light emitting layer arranged with the substrate in a first direction;
- a first semiconductor layer provided between the substrate and the light emitting layer, the first semiconductor layer including a first portion and a second portion, the first portion and the second portion including a nitride semiconductor, the first portion having a first lattice polarity, and the second portion having a second lattice polarity different from the first lattice polarity;
- a second semiconductor layer provided between the first semiconductor layer and the light emitting layer, the second semiconductor layer being of a first conductivity type;
- a third semiconductor layer of the second conductivity type, the light emitting layer being provided between the second semiconductor layer and the third semiconductor layer;
- and
- an In-containing layer provided between the second semiconductor layer and die light emitting layer, the In-containing layer including a nitride semiconductor including In,
- the light emitting layer including a nitride semiconductor including In,
- a composition ratio of In in the In-containing layer being different from a composition ratio of In in the light emitting layer,
- a lattice length of the In-containing layer in a-axis direction being not less than 0.1% greater than a lattice length of the second semiconductor layer in the a-axis direction, and
- a difference of the lattice length of the In-containing layer in the a-axis direction and the lattice length of the light emitting layer in the a-axis direction is not more than 0.1%.
Dependencies are inferred from the claim text.