Semiconductor device and method for manufacturing the same
AssigneeUnited Microelectronics Corp.
InventorsShih-Chang Tsai, Tzu-Chin Tseng, Hsiao-Ting Lin, Chang-Yih Chen, Sam Lai
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AssigneeUnited Microelectronics Corp.
InventorsShih-Chang Tsai, Tzu-Chin Tseng, Hsiao-Ting Lin, Chang-Yih Chen, Sam Lai
Estimating the term…
A semiconductor device and a method for manufacturing the same. The method includes steps hereinafter. A substrate is provided with a first dielectric layer thereon. The first dielectric layer is provided with a trench. Then, a metal layer is formed to fill the trench and to cover the surface of the first dielectric layer. The metal layer is partially removed so that a remaining portion of the metal layer covers the first dielectric layer. A treatment process is performed to transform the remaining portion of the metal layer into a passivation layer on the top portion and a gate metal layer on the bottom portion. A chemical-mechanical polishing process is performed until the first dielectric layer is exposed so that a remaining portion of the passivation layer remains in the trench.
A method for manufacturing a semiconductor device, comprising steps of:
A semiconductor device, comprising:
Dependencies are inferred from the claim text.