Strain relaxation using metal materials and related structures
AssigneeSoitec
InventorChristiaan J. Werkhoven
Life of this patent
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AssigneeSoitec
InventorChristiaan J. Werkhoven
Estimating the term…
Methods of fabricating semiconductor structures include forming a plurality of openings extending through a semiconductor material and at least partially through a metal material and deforming the metal material to relax a remaining portion of the semiconductor material. The metal material may be deformed by exposing the metal material to a temperature sufficient to alter (i.e., increase) its ductility. The metal material may be formed from one or more of hafnium, zirconium, yttrium, and a metallic glass. Another semiconductor material may be deposited over the remaining portions of the semiconductor material, and a portion of the metal material may be removed from between each of the remaining portions of the semiconductor material. Semiconductor structures may be formed using such methods.
A semiconductor structure, comprising:
A semiconductor structure formed during fabrication of an engineered substrate, the semiconductor structure comprising one or more at least substantially relaxed islands of III-V type semiconductor material on a ductile metal overlying a base substrate, the ductile metal exhibiting a ductility sufficient to provide redistribution of the ductile metal during strain relaxation of the one or more at least substantially relaxed islands of III-V type semiconductor material on the ductile metal, wherein the ductile metal comprises at least one of hafnium, zirconium, yttrium, an alloy of one or more such metals, and a metallic glass.
Dependencies are inferred from the claim text.