Clear mottle analyzer for multilayer laminates
AssigneeSolutia Inc.
InventorJeffrey B. Hurlbut
Life of this patent
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Abstract
This disclosure relates to systems, devices and methods utilized to quantitatively measure the level of mottle in multilayer laminates. The systems and method are generally free of the inconsistencies, variability and inherent biases of the traditional subjective process by which a person of ordinary skill in the art can assess and categorize the mottle of a multilayer laminate. In the method, variations in the images of mottle produced by a shadowgraph are quantified, measured and classified.
Claims18
A computerized method for quantitatively determining the mottle value of a transparent multilayer laminate comprising two substrates and at least one polymer interlayer disposed between the substrates, the method comprising:
- providing a computer having non-transitory computer readable memory;
- providing a transparent low mottle material and a transparent standard laminate comprising two substrates and at least one standard polymer interlayer disposed between the substrates, wherein the standard laminate has a known mottle value;
- creating calibration shadowgraphs of the low mottle material and the standard laminate;
- capturing calibration images of the calibration shadowgraphs;
- storing the calibration images to the memory;
- providing a transparent multilayer test laminate for which the clear mottle value is to be determined, wherein the multilayer test laminate comprises two substrates and at least one polymer interlayer disposed between the substrates;
- creating a test shadowgraph of the multilayer test laminate;
- capturing a test image of the test shadowgraph on a digital camera, the image having pixels;
- storing the test image to the memory;
- and
- comparing the test image to the calibration images using the computer to calculate a mottle value.
A clear mottle analyzer device for quantitatively determining the mottle value of a transparent multilayer laminate, the device comprising:
- a surface that is capable of showing a shadowgraph;
- a source of light, the source being configured to shine light through the multilayer laminate to form the shadowgraph on the surface;
- a holder placed between the surface and the source of light, the holder being configured to hold a transparent multilayer laminate comprising two substrates and at least one polymer interlayer disposed between the substrates;
- a digital camera located perpendicular to the surface;
- and
- a system for image capture and data analysis, the system being in communication with the digital camera, and being configured for capturing calibration images of calibration shadowgraphs of transparent materials and standard laminates, for capturing a test image of the test shadowgraph of the transparent multilayer laminate, and for comparing the test image to the calibration images to calculate a mottle value for the transparent multilayer laminate;
- wherein the surface, holder, camera, and source of light are housed within an enclosure with the holder and surface being substantially parallel to one another.
A non-transitory computer readable memory for use in a system for quantitatively determining the mottle value of a transparent multilayer laminate, said memory comprising:
- computer readable instructions for capturing calibration images of calibration shadowgraphs formed by shining light through transparent materials and standard laminates;
- computer readable instructions for capturing a test image of a test shadowgraph formed by shining light through a transparent multilayer laminate that comprises two substrates and at least one polymer interlayer disposed between the substrates;
- computer readable instructions for comparing the test image to the calibration images using the computer to calculate a mottle value wherein the computer readable instructions for comparing:
- converts the test image and calibration images into a matrix to obtain the numerical value of the pixels;
- extracts a slice of the matrix, wherein the slice is the center of the matrix;
- plots the pixel values of the slice as a function of pixel number to form a profile;
- and
- quantifies the mottle value of the multilayer laminate from the profile.
Dependencies are inferred from the claim text.