Net-voltage-aware optical proximity correction (OPC)

A system comprising:

• at least one computing device configured to verify an integrated circuit (IC) layout by performing actions including:
• obtaining data about a process variation band for at least one physical feature in the IC layout;
• determining voltage-based process variation band thresholds for the at least one physical feature in the IC layout;
• determining whether the process variation band for the at least one physical feature in the IC layout meets design specifications for the IC layout based upon the voltage-based process variation band thresholds for the at least one physical feature in the IC layout;
• and
• modifying the IC layout in response to a determination that the process variation band for the at least one physical feature does not meet the design specifications.

A computer program product comprising program code stored on a non-transitory computer readable storage medium, which when executed by at least one computing device, causes the at least one computing device to verify an integrated circuit (IC) layout by performing actions including:

• obtaining data about a process variation band for at least one physical feature in the IC layout;
• determining voltage-based process variation band thresholds for the at least one physical feature in the IC layout;
• determining whether the process variation band for the at least one physical feature in the IC layout meets design specifications for the IC layout based upon the voltage-based process variation band thresholds for the at least one physical feature in the IC layout;
• and
• modifying the IC layout in response to a determination that the process variation band for the at least one physical feature does not meet the design specifications.