Method of identifying materials from multi-energy X-rays
AssigneeCommissariat A L' Energie Atomique Et Aux Energies Alternatives
InventorsJean Rinkel, Guillaume Beldjoudi, Jean-Marc Dinten, Georges Gonon, Veronique Rebuffel
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Abstract
A calibration method for a device for identifying materials using X-rays, including: a) determining at least one calibration material and, for each calibration material, at least one calibration thickness of this material, b) measuring, for each of the calibration materials and for each of the selected calibration thicknesses, attenuation or transmission coefficients for X radiation, c) calculating statistical parameters from the coefficients, d) determining or calculating, for each calibration material and for each calibration thickness, a presence probability distribution law, as a function of the statistical parameters.
Claims23
A calibration method for a device for identifying an unknown material using X-rays, the method comprising:
- a) determining at least one calibration material (i) and, for each calibration material, at least one calibration thickness (j) of the respective material;
- b) measuring, for each of the calibration materials and for each of the determined calibration thicknesses, N attenuation or transmission coefficients αK for X radiation, with N≧2;
- c) setting up a vector {right arrow over (αP)}, said vector representing N attenuation or attenuation coefficients αK;
- d) repeating operations b) and c), with said calibration material, so that L vectors αp are obtained, L representing the number of measurements performed with a same calibration material having material i and thickness j;
- e) calculating statistical parameters from said L vectors αp;
- and
- f) determining or calculating, from said statistical parameters, a presence probability distribution law fij, as a function of said statistical parameters, to identify the unknown material, said presence probability distribution depending on said calibration material.
A device for identifying X radiography materials, the device comprising:
- circuitry configured to
- a) determine at least one calibration material (i) and, for each material, at least one thickness (j) for the respective material,
- b) measure, for each of the calibration materials and for each of the determined calibration thicknesses, N attenuation or transmission coefficients αK for X radiation, with N≧2,
- c) set up a vector {right arrow over (αP)}, said vector representing N attenuation or attenuation coefficients αK,
- d) repeat operations b and c, with said calibration material, so that L vectors αp are obtained, L representing the number of measurements performed with a same calibration material having material i and thickness j,
- e) calculate statistical parameters from said L vectors αp;
- f) determine or calculate, from said statistical parameters, a presence probability distribution law fij, as a function of said statistical parameters, said presence probability distribution depending on said calibration material, and
- g) determine at least a nature of a material, as a function of said probability distribution laws, to identify the material.
Dependencies are inferred from the claim text.