Circuit arrangement and method for testing same

A method for testing integrated circuitry, comprising:

• providing a circuit arrangement with a plurality of functional units that are coupled together by at least one streaming data bus, wherein each of the functional units comprise a plurality of hardware modules and a switch matrix, wherein the switch matrix has at least one streaming data input and at least one streaming data output and is connected between a streaming data input and a streaming data output of the respective functional unit and is further coupled to each of the hardware modules of the respective functional unit;
• providing at least one of the streaming data busses with a data width of at least that of the widest hardware module of any of the functional units of the circuit arrangement;
• configuring the switch matrices of the circuit arrangement to establish a streaming data path between and through the plurality of functional units;
• and
• using the streaming data path as a test link for any of the hardware modules.

A circuit arrangement, comprising:

• a plurality of functional units coupled together by one or more streaming data busses, wherein each of the plurality of functional units comprise:
• a plurality of hardware modules that operate alone or together to provide a function of a respective one of the functional units;
• a switch matrix operably associated with the plurality of hardware modules of a respective functional unit, and configured to provide a unique switching configuration to facilitate a flow of data through or around one or more of the plurality of hardware modules of the respective functional unit,
• wherein each functional unit comprises a unit streaming data input and a unit data streaming output, and wherein the unit streaming data input of a first functional unit of the plurality of functional units comprises a streaming data input of the circuit arrangement, wherein the unit streaming data output of the first functional unit is coupled to a unit streaming data input of a next functional unit of the plurality of functional units via at least one of the one or more streaming data busses, wherein a unit streaming data output of a last functional unit of the plurality of functional units comprises a streaming data output of the circuit arrangement, and wherein a unit streaming data input of the last functional unit is coupled to a unit streaming data output of a previous functional unit of the plurality of functional units, and
• wherein at least one of the streaming data busses has a data width of at least that of the widest hardware module of any of the functional units of the circuit arrangement to be configurable as a test link for any of the hardware modules.