Increasing the dynamic range of an integrator based mutual-capacitance measurement circuit
AssigneeAtmel Corporation
InventorsIngar Hanssen, Rian Whelan
Life of this patent
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AssigneeAtmel Corporation
InventorsIngar Hanssen, Rian Whelan
Estimating the term…
In one embodiment, a method includes deactivating an integrator of a mutual-capacitive measurement circuit and configuring the mutual-capacitive measurement circuit according to a first voltage configuration. The first voltage configuration results in a charge on a sensor capacitor and a compensation capacitor when a supply voltage is applied to the mutual-capacitive measurement circuit. The method also includes adjusting a variable reference voltage input of the integrator to a first reference voltage, wherein the first reference voltage is selected to increase an output range of the mutual-capacitive measurement circuit. The method also includes applying the supply voltage to the mutual-capacitive measurement circuit and obtaining a first reference measurement from an analog-digital-converter coupled to an output of the mutual-capacitance measurement circuit.
A method of detecting a change in capacitance, comprising:
An apparatus comprising:
A method of detecting a change in capacitance, comprising:
Dependencies are inferred from the claim text.