Adaptive test sequence for testing integrated circuits

A method comprising:

• testing a first plurality of devices comprising executing a first test item and a second test item for the first plurality of devices, wherein a second plurality of devices among the first plurality of devices is most recently tested devices, and a first total count of the first plurality of devices is greater than a second total count of the second plurality of devices, and wherein among the second plurality of devices, a third plurality of devices failed on the first test item, and a fourth plurality of devices failed on the second test item;
• calculating a first test priority of the first test item, wherein the calculating the first test priority comprises dividing a first total count of the third plurality of devices by the second total count of the second plurality of devices to generate a first quotient;
• calculating a second test priority of the second test item, wherein the calculating the second test priority comprises dividing a second total count of the fourth plurality of devices by the second total count of the second plurality of devices to generate a second quotient;
• generating a first test sequence, wherein in the first test sequence, a first one of the first test item and the second test item having a higher test priority is placed ahead of a second one of the first test item and the second test item;
• and
• testing a device in an order of the first test sequence.