High speed tester communication interface between test slice and trays
AssigneeAdvantest Corporation
InventorsEric Kushnick, Mei-Mei Su, Roland Wolff
Life of this patent
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Abstract
A tester system is disclosed. The tester system comprises a tester module operable to generate test signals for testing a plurality of DUTs. It also comprises a plurality of cables operable to communicatively couple the tester module with a tray comprising the plurality of DUTs through a thermal chamber wall interface. Further, it comprises a plurality of connectors in contact with the tray, wherein the plurality of connectors is operable to provide an interface between the plurality of cables and conductive traces on the tray, and further wherein each of the plurality of connectors is operable to pass a respective subset of the test signals to each DUT on the tray via the conductive traces.
Claims20
A method for testing using an automated test equipment (ATE), said method comprising:
- transmitting test signals generated by a tester module for testing a plurality of DUTs through a thermal chamber wall interface using a plurality of cables;
- communicating said test signals to a tray comprising said plurality of DUTs using said plurality of cables, wherein said plurality of cables communicatively couple said tester module to said tray;
- and
- passing a respective subset of said test signals to each DUT on said tray via one of a plurality of connectors in contact with said tray, wherein said plurality of connectors provide an interface between said plurality of cables and conductive traces on said tray, and wherein said plurality of connectors make contact with a bottom of said tray using a spring mechanism, wherein said spring mechanism is operable to push up on said tray to allow said plurality of connectors to make contact with said tray.
A tester system comprising:
- a tester module operable to generate test signals for testing a plurality of DUTs;
- a plurality of cables operable to communicatively couple said tester module with a tray comprising said plurality of DUTs through a thermal chamber wall interface;
- and
- a plurality of connectors in contact with said tray, wherein said plurality of connectors is operable to provide an interface between said plurality of cables and conductive traces on said tray, and further wherein each of said plurality of connectors is operable to pass a respective subset of said test signals to each DUT on said tray via said conductive traces and wherein said plurality of connectors make contact with a bottom of said tray using a spring mechanism, wherein said spring mechanism is operable to push up on said tray to allow said plurality of connectors to make contact with said tray.
A test equipment apparatus comprising:
- a tester tray comprising sockets operable to communicatively couple said tester tray with a plurality of DUTs;
- and
- a plurality of connectors in contact with said tester tray, wherein said plurality of connectors is operable to provide an interface between test signals received via cables and conductive pads on said tester tray, and wherein each of said plurality of connectors is operable to pass a respective subset of said test signals to each DUT on said tester tray via said conductive pads and wherein said plurality of connectors make contact with a bottom of said tray using a spring mechanism, wherein said spring mechanism is operable to push up on said tray to allow said plurality of connectors to make contact with said tray, and
- further wherein each connector from said plurality of connectors comprises:
- an interposer operable to communicatively couple said test signals with pads on said tray;
- a connector operable to receive said test signals through said cables;
- and
- a printed circuit board for interfacing said interposer with said connector.
Dependencies are inferred from the claim text.