Monitoring aging of silicon in an integrated circuit device

A computer program product comprising a computer readable storage medium having a computer readable program stored therein, wherein the computer readable program, when executed on a computing device, causes the computing device to:

• for each core in a set of cores in the multi-core processor executing in the computing device, determine, by age determination logic executing in the data processing system, a temperature via temperature monitoring logic, a voltage via voltage monitoring logic, and a frequency via frequency monitoring logic at regular intervals for a set of degradations and a set of voltage domains, thereby forming the modeled age of the multi-core processor, wherein the temperature, the voltage, and the frequency are measurements of run-time operational characteristics experienced by each core of the set of cores and wherein the computer readable program to form the modeled age of the multi-core processor further causes the computing device to:
• for each degradation in the set of degradations, each voltage domain in the set of voltage domains, and each core in the set of cores, compute, by the age determination logic, a time at a reference condition (tref) value utilizing the determined temperature, voltage, and frequency of the current interval;
• and
• increase, by the age determination logic, a current value for the modeled age of the multi-core processor by the tref value;
• determine, by the age determination logic, whether the modeled age of the multi-core processor is greater than an end-of-life value;
• and
• responsive to the modeled age of the multi-core processor being greater than an end-of-life value, send, by the determination logic, an indication that the multi-core processor requires replacement.

An apparatus, comprising:

• a processor;
• and
• a memory coupled to the processor, wherein the memory comprises instructions which, when executed by the processor, cause the processor to:
• for each core in a set of cores in the multi-core processor executing in the apparatus, determine, by age determination logic executing in the data processing system, a temperature via temperature monitoring logic, a voltage via voltage monitoring logic, and a frequency via frequency monitoring logic at regular intervals for a set of degradations and a set of voltage domains, thereby forming the modeled age of the multi-core processor, wherein the temperature, the voltage, and the frequency are measurements of run-time operational characteristics experienced by each core of the set of cores and wherein the instructions to form the modeled age of the multi-core processor further cause the processor to:
• for each degradation in the set of degradations, each voltage domain in the set of voltage domains, and each core in the set of cores, compute, by the age determination logic, a time at a reference condition (tref) value utilizing the determined temperature, voltage, and frequency of the current interval;
• and
• increase, by the age determination logic, a current value for the modeled age of the multi-core processor by the tref value;
• determine, by the age determination logic, whether the modeled age of the multi-core processor is greater than an end-of-life value;
• and
• responsive to the modeled age of the multi-core processor being greater than an end-of-life value, send, by the age determination logic, an indication that the multi-core processor requires replacement.