Load and source pull test system for RF and baseband frequencies
OwnerChristos Tsironisinventor
Life of this patent
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Abstract
A load pull measurement setup allows independent impedance tuning at RF frequencies at the output of the DUT as well as independent tuning at RF and baseband frequencies of the modulated signal at the input of the DUT. This allows optimizing baseband frequency impedances for nonlinear amplifier performance when processing modulated signal, such as IMD, ACPR etc. Baseband tuning is done using a low frequency programmable impedance tuner, which is connected through the input bias tee, which acts as a frequency separator (diplexer). The input bias tee may be an LC based network or a 3 dB matched coupler based network.
Claims7
A test setup comprising a cascade of a low frequency modulated RF signal source, an input and an output DC bias network, said input bias network having an input (RF) port, an output (RF & DC) port and a bias (DC) port, and said output bias network having an input (RF & DC) port, an output (RF) port and a bias (DC) port;
- and an automated single probe input high frequency (RF) impedance tuner, a test fixture having an input section and an output section, a device to be tested (DUT), mounted between the input and output sections of said test fixture, an automated single probe output (RF) impedance tuner and an RF load;
- and an automated, baseband low frequency (LF) impedance tuner comprising sections of series coaxial lines and shunt variable capacitors, said LF tuner being connected in series between the input DC port of the input bias network and RF grounded DC bias supply.
Dependencies are inferred from the claim text.