Power device analyzer

A device analyzer comprising:

• a collector supply configured to generate a plurality of supply signal pulses with selected voltage or current levels and a supply signal pulse width at a high current capacity at a collector supply source terminal when a device-under-test (“DUT”) is connected to form a current path between the collector supply source terminal and a collector supply common terminal, the collector supply comprising:
• a current source to generate current up to a peak current rating;
• a current source capacitor disposed across the current source configured to enable the current source to charge the current source capacitor, and configured to supply a collector supply current to the current path, the current source capacitor configured to provide the high current capacity of the collector supply that is higher than the peak current rating of the current source:
• a supply voltage generator configured to generate a plurality of variable voltage pulses with the supply signal pulse width and selected voltage levels on the collector supply source terminal;
• and a buffer amplifier connected to buffer the variable voltage pulses from the supply voltage generator, the buffer amplifier powered by the current source capacitor to provide substantially all of the collector supply current from the current source capacitor at the collector supply source terminal;
• a supply switch connected to the collector supply source terminal, the supply switch triggered to close and open the current path in a narrow pulse width narrower than the supply signal pulse width to conduct the plurality of supply signal pulses as a plurality of narrowed sweep signal pulses having the high current capacity of the collector supply current, or to regulate the current in the current path to a selected constant current level;
• wherein the supply switch is controlled by a supply switch driver configured to generate switch trigger pulses having a narrow pulse width, the switch pulses generated by a supply switch driver;
• a first DUT port configured to connect to the supply switch;
• a second DUT port configured to connect to the collector supply common terminal, where the plurality of supply signal pulses are applied to the DUT when the DUT is connected to the first and second DUT ports;
• a voltage meter configured to measure a DUT voltage across the DUT within the narrow pulse width of the narrowed sweep signal pulses when the plurality of sweep signal pulses at the DUT are the plurality of narrow sweep signal pulses;
• and a current meter configured to measure a DUT current through the DUT within the narrow pulse width of the narrowed sweep signal pulses when the plurality of sweep signal pulses at the DUT are the plurality of narrow sweep signal pulses.