Automatic analyzer and analysis method
AssigneeHitachi High-Technologies Corporation
InventorsKumiko Kamihara, Satoshi Mitsuyama, Tomonori Mimura, Chihiro Manri
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AssigneeHitachi High-Technologies Corporation
InventorsKumiko Kamihara, Satoshi Mitsuyama, Tomonori Mimura, Chihiro Manri
Estimating the term…
In known automatic analyzers for detecting an abnormality by approximating reaction process data using a function, accuracy of detecting a reaction abnormality is degraded because of poor approximation accuracy depending on test items. Data processing means stores the absorbance and time of day at which the absorbance is measured as time-series data. Letting x denote absorbance, t denote time, and * denote a symbol representing multiplication, we have a function x=a0+a1*exp(−k1*t)+a2*exp(−k2*t). Values of parameters a0, a1, a2, ai, k1, and k2 are calculated so that a difference between the absorbance at the measured time calculated using the above expression and the time-series data is minimal, and presence of an abnormality is determined based on the parameter values.
An automatic analyzer comprising:
An automatic analyzer comprising:
An automatic analyzer comprising:
An analysis method of an automatic analyzer including a sample disk holding a plurality of sample vessels;
An analysis method of an automatic analyzer including a sample disk holding a plurality of sample vessels;
Dependencies are inferred from the claim text.