Test apparatus and method of controlling the same
AssigneeSamsung Electronics Co., Ltd.
InventorsSe Do Gwon, Kyu Tae Kang
Life of this patent
Estimating the term…
Abstract
A test apparatus, which may compare detection data of a detector with reference data and correct a positional error in the detector due to the failing of a motor, and a method of controlling the same are provided. The test apparatus includes a detector configured to irradiate light to a plurality of chambers of a reaction device and detect a detection target, a motor configured to move the detector such that light is irradiated to the plurality of chambers, and a controller configured to compare detection data of the detector regarding the reaction device with reference data, determine a positional error in the detector, and correct the positional error.
Claims20
A test apparatus comprising:
- a detector configured to irradiate light to a plurality of chambers of a reaction device and detect a detection target;
- a motor connected to the detector to move the detector such that light is irradiated to the plurality of chambers;
- and a controller configured to compare detection data received from the detector regarding the reaction device with reference data, determine a positional error in the lateral movement of the detector, and correct the lateral positional error.
A method of controlling a test apparatus,
- comprising:
- driving a motor configured to move a detector which is connected to the motor in a first direction;
- comparing detection data regarding a plurality of chambers of a reaction device while the detector is moving, with reference data and determining a positional error in the lateral movement of the detector;
- and correcting the lateral positional error.
Dependencies are inferred from the claim text.