Apparatus and method for automatic inspection of through-holes of a component
AssigneeSiemens Aktiengesellschaft
InventorsRonny Jahnke, Tristan Sczepurek
Life of this patent
Estimating the term…
Loading patent…
AssigneeSiemens Aktiengesellschaft
InventorsRonny Jahnke, Tristan Sczepurek
Estimating the term…
An apparatus and a method for automatic inspection of through-holes of a component is provided. The proposed apparatus includes an imaging module, an image processing module and an analysis module. The imaging module generates a thermographic image of the component by passing a medium through the through-holes and capturing infra-red radiation emitted from the component while the medium is flowing through the through-holes. The image processing module fits the thermographic image on a digital image obtained from geometrical data of the component. The image processing module is further masks the fitted thermographic image using a digital image mask to extract regions corresponding to through-holes in the thermographic image. The digital image mask is computed based on a determination of positions of through-holes on the digital image. The analysis module evaluates the masked thermographic image to determine an irregularity or blockage in one or more of the through-holes.
A method for automatic inspection of a plurality of through-holes of a component, comprising:
An apparatus for automatic inspection of a plurality of through-holes of a component, comprising:
Dependencies are inferred from the claim text.