Method of testing an electronic system

A method of testing an electronic system having a plurality of pieces of equipment and connections between these pieces of equipment, the method using a test sequencer device to perform at least one test session running a test procedure comprising at least two test cases, each test case being performed by injecting into the electronic system under test at least one value for at least one simulated input parameter of the electronic system with a test performance device for picking up at least one stable output from the electronic system, the method having the following steps:

• a) during a reference session:
• automatically performing a test case referred to as an “initial reference case” with the test performance device, and temporarily storing at least one output from the electronic system, referred to as an “initial reference output” as obtained with the initial reference case;
• automatically performing at least one test case referred to as a “subsequent reference case” with the test performance device, and temporarily storing at least one output from the electronic system, referred to as a “subsequent reference output” as obtained with this subsequent reference case, and
• for each subsequent reference case, storing in a reference memory a difference referred to as a “reference difference” that exists between the subsequent reference output and the initial reference output and as determined automatically with a processor device, and associating this reference difference with a qualifier given by an operator indicating whether the reference difference corresponds to a result that is satisfactory or not satisfactory;
• and
• b) for each test session:
• during a test stage, automatically performing a test case referred to as an “initial test case”, corresponding to the initial reference case, with the test performance device, and temporarily storing at least one output from the electronic system, referred to as an “initial test output” as obtained with this initial test case;
• automatically using the test performance device to perform at least one test case, each referred to as a “subsequent test case”, corresponding to a “subsequent reference case”, and temporarily storing at least one output from the electronic system, referred to as a “subsequent test output” as obtained during this subsequent test case;
• during a comparison stage for each subsequent test case:
• storing in a test memory a difference referred to as a “test difference”, existing between the initial test output and the subsequent test output and as determined automatically with the processor device;
• and
• storing in a test memory a difference referred to as a “test comparison” existing between the test difference and a corresponding reference difference and determined automatically with the processor device;
• and
• during an analysis stage:
• if for a test case the test comparison does not reveal any variation between the test difference and the reference difference, using the processor device to allocate automatically to the test difference the qualifier of the corresponding reference difference.