Global shutter bulk charge modulated device
AssigneeSemiconductor Components Industries, LLC
InventorsJaroslav Hynecek, Gennadiy Agranov, Xiangli Li, Hirofumi Komori, Xia Zhao, Chung Chun Wan
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AssigneeSemiconductor Components Industries, LLC
InventorsJaroslav Hynecek, Gennadiy Agranov, Xiangli Li, Hirofumi Komori, Xia Zhao, Chung Chun Wan
Estimating the term…
The invention describes image sensor array pixels with global and rolling shutter capabilities that utilize multiple BCMD transistors for storing and sensing charge for a single photodiode. This configuration improves the Dynamic Range (DR) of the sensor, by allowing sensing different image signals from a single pixel without saturation, a low level signal with long integration time followed by a high level signal with short integration time. Signal processing circuits can process these signals into a single Wide Dynamic Range (WDR) output. Further disclosed are pixels that use multiple-gate BCMD transistors for charge storage and sensing having multiple concentric gates, which allows changing the conversion gain of the BCMD transistors. Variable conversion gain is a useful feature when building WDR sensors since low conversion gain and high well capacity allows detection of high level signals and, at the same time, low level signals with high conversion gain and low noise.
A CMOS image sensor pixel array that includes at least one pixel circuit, comprising:
An array of image pixels each of which comprises:
An image pixel, comprising:
Dependencies are inferred from the claim text.