Manufacturing method of semiconductor substrate and semiconductor device
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorShunpei Yamazaki
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AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorShunpei Yamazaki
Estimating the term…
Provided is a highly integrated semiconductor device, a semiconductor device with large storage capacitance with respect to an area occupied by a capacitor, a semiconductor device capable of high-speed writing or reading, a semiconductor device with low power consumption, or a highly reliable semiconductor device. Provided are steps of forming a first oxide semiconductor over a first substrate, forming a first insulator over the first oxide semiconductor, injecting an ion into a region of the first oxide semiconductor through the first insulator, bonding a surface of the first insulator provided with the first substrate to a surface of a second insulator over a second substrate, performing a heat treatment in a state where the surfaces are bonded, separating the first substrate from the second substrate along the region of the first oxide semiconductor, and forming a second oxide semiconductor over the second substrate.
A manufacturing method of a semiconductor substrate comprising:
A manufacturing method of a semiconductor substrate comprising:
A manufacturing method of a semiconductor substrate comprising:
A manufacturing method of a semiconductor substrate comprising:
Dependencies are inferred from the claim text.