Device and method for forming resistive random access memory cell
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChih-Yang Chang, Wen-Ting Chu, Yu-Wei Ting, Chun-Yang Tsai, Kuo-Ching Huang
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChih-Yang Chang, Wen-Ting Chu, Yu-Wei Ting, Chun-Yang Tsai, Kuo-Ching Huang
Estimating the term…
A device and method for forming resistive random access memory cell are provided. The method includes: providing a first voltage to a first word line connected to a first RRAM cell to form the first RRAM cell; and providing a negative voltage to a second word line connected to a second RRAM cell that shares a first source line and a first bit line with the first RRAM cell. An exemplary device includes: a first RRAM cell, a second RRAM cell, a first voltage source and a charge pump circuit. The first RRAM cell is connected to a first word line. The second RRAM cell is connected to a second word line. The first voltage source provides a first voltage to the first word line to form the first RRAM cell. The charge pump circuit provides a negative voltage to the second word line.
A method for forming a resistive random access memory (RRAM) cell, comprising:
Dependencies are inferred from the claim text.