Query operations for stacked-die memory device

A method comprising:

• providing a stacked-die memory device including a set of one or more stacked memory dies implementing random access memory cell circuitry, and a set of one or more logic dies electrically coupled to the random access memory cell circuitry, the set of one or more logic dies having a query controller and a memory controller;
• and
• performing, via the query controller, a query operation on data stored in the random access memory cell circuitry in response to a query command received from a device external to the stacked-die memory device via the memory controller, the query operation comprising a search of memory locations of the random access memory cell circuitry for information sought by the query command.

A stacked-die memory device comprising:

• a set of one or more stacked memory dies implementing random access memory cell circuitry, the random access memory cell circuitry implementing a key-value store as a cache, the key-value store comprising a plurality of key-value locations, each key value location having a key field to serve as a cache tag field and a data object field to serve as a cache line field;
• and
• a set of one or more logic dies electrically coupled to the memory cell circuitry, the set of one or more logic dies comprising a memory controller and cache access logic, wherein the memory controller is coupleable to at least one device external to the stacked-die memory device, and wherein in response to a cache access command from the external device identifying an address value, the cache access logic is to determine whether there is a cache hit by searching the key fields for a tag that matches the address value.