Adaptive switching voltage regulator

A device, comprising:

• a first transistor having a gate configured to receive a first signal;
• a second transistor having a gate configured to receive a second signal;
• a controller configured to:
• measure at least one of a difference between a rising edge of the first signal and an associated rising edge of the second signal and a difference between a falling edge of the first signal and an associated falling edge of the second signal, and
• delay one of the first signal and the second signal if the rising edge of the first signal occurs before or after the associated rising edge of the second signal or if the falling edge of the first signal occurs before or after the associated falling edge of the second signal;
• a first forward path including a first programmable delay unit and configured for conveying the first signal to the first transistor;
• a first feedback path coupled to the first forward path and including the controller configured to receive a first feedback signal based on the first signal;
• a second forward path including a second programmable delay unit and configured for conveying the second signal to the second transistor;
• and
• a second feedback path coupled to the second forward path and including the controller configured to receive a second feedback signal based on the second signal.

A device, comprising:

• a first transistor having a gate configured to receive a first signal;
• a second transistor having a gate configured to receive a second signal;
• a controller configured to:
• measure at least one of a difference between a rising edge of the first signal and an associated rising edge of the second signal and a difference between a falling edge of the first signal and an associated falling edge of the second signal, and
• delay one of the first signal and the second signal if the rising edge of the first signal occurs before or after the associated rising edge of the second signal or if the falling edge of the first signal occurs before or after the associated falling edge of the second signal;
• an N-to-P non-overlap unit for measuring an amount of N-to-P non-overlap between the first and second signal;
• an N-to-P overlap unit for measuring an amount of N-to-P overlap between the first and second signal;
• a P-to-N non-overlap unit for measuring an amount of P-to-N non-overlap between the first and second signal;
• and
• a P-to-N overlap unit for measuring an amount of P-to-N overlap between the first and second signal.

A method, comprising:

• measuring a difference between at least one of a rising edge of a first signal applied to a gate of a first transistor and an associated rising edge of a second signal applied to a gate of a second transistor and a falling edge of the first signal and an associated falling edge of the second signal;
• delaying one of the first signal and the second signal if the rising edge of the first signal occurs before or after the associated rising edge of the second signal or if the falling edge of the first signal occurs before or after the associated falling edge of the second signal;
• conveying the first signal to the first transistor via a first forward path including a first programmable delay unit;
• receiving a first feedback signal based on the first signal via a first feedback path coupled to the first forward path for the measuring the difference and the delaying the one of the first signal and the second signal;
• conveying the second signal to the second transistor via a second forward path including a second programmable delay unit;
• receiving a second feedback signal based on the second signal via a second feedback path coupled to the second forward path for the measuring the difference and the delaying the one of the first signal and the second signal.

A method, comprising:

• measuring a difference between at least one of a rising edge of a first signal applied to a gate of a first transistor and an associated rising edge of a second signal applied to a gate of a second transistor and a falling edge of the first signal and an associated falling edge of the second signal;
• delaying one of the first signal and the second signal if the rising edge of the first signal occurs before or after the associated rising edge of the second signal or if the falling edge of the first signal occurs before or after the associated falling edge of the second signal;
• measuring an amount of N-to-P non-overlap between the first and second signal;
• measuring an amount of N-to-P overlap between the first and second signal;
• measuring an amount of P-to-N non-overlap between the first and second signal;
• and
• measuring an amount of P-to-N overlap between the first and second signal.