Testing apparatus and testing method of electronic device

A testing apparatus configured to test a bus between at least two electronic devices on a circuit board, the circuit board comprising at least two sockets, the electronic devices being configured to electrically connect the corresponding sockets on the circuit board, respectively, the testing apparatus comprising:

• at least two device transfer plates electrically connected to the electronic devices corresponding to the device transfer plates and electrically connected to the sockets corresponding to the electronic devices;
• and
• a testing circuit electrically connected to the device transfer plates respectively through at least two sets of serial signal wire pairs, wherein the testing circuit, according to types of the electronic devices, provides a serial signal to one of the device transfer plates through the corresponding serial signal wire pair and receives a response from another one of the device transfer plates through the corresponding serial signal wire pair, so as to test whether an open circuit is occurred to the bus between the electronic devices respectively corresponding to the device transfer plates,
• wherein the serial signal wire pairs and the device transfer plates are connected in one-to-one correspondence.