Method and system for logic built-in self-test
AssigneeFreescale Semiconductor, Inc.
InventorsNitin Singh, Amit Jindal, Anurag Jindal
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Abstract
A controller executes a first LBIST test on a device at a first shift frequency on a plurality of partitions and detects any voltage drop at sense points in each partition during the test. If a voltage drop is detected, then the test is re-run for those partitions that failed the first test. If failures are detected during the re-execution, then a further test at a lower shift frequency is performed. The partitions can be tested sequentially or in parallel and invention has the advantage of reducing the time taken for executing LBIST when the device is booted.
Claims12
An integrated circuit, comprising:
- a plurality of partitions testable using Logic Built-in Self Test (LBIST);
- a controller operably coupled to each of the partitions;
- and
- at least one voltage monitor, operably coupled to the controller and to each partition, for comparing a voltage value of a supply voltage of each partition with a reference voltage value and generating a trigger signal depending on the comparison,
- wherein the controller is arranged to execute a first LBIST test on at least some of the partitions and to detect a partition failing the first LBIST test, and if a trigger signal is received at the controller from the at least one voltage monitor during the first LBIST test, to execute a second LBIST test on the partitions that failed the first test.
A method for testing an integrated circuit using Logic Built-in Self-test (LBIST), wherein the integrated circuit includes a plurality of partitions and an LBIST controller, the method comprising:
- executing a first LBIST test on at least some of the partitions;
- comparing a voltage value of a supply voltage in each of the partitions undergoing the first LBIST test with a reference voltage value, by the LBIST controller;
- generating a trigger signal, by the LBIST controller, depending on the comparison;
- detecting, by the LBIST controller, a partition failing the first LBIST test;
- and
- if a trigger signal was generated during the first LBIST test, then executing a second LBIST test on the partitions that failed the first LBIST test.
Dependencies are inferred from the claim text.