Tester and method for testing a strip of devices
AssigneeFreescale Semiconductor, Inc.
InventorsChad S. Dawson, Stephen R. Hooper, Peter T. Jones, Mark E. Schlarmann
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AssigneeFreescale Semiconductor, Inc.
InventorsChad S. Dawson, Stephen R. Hooper, Peter T. Jones, Mark E. Schlarmann
Estimating the term…
A tester configured to test a strip of devices is provided. The tester may include a communications system, a plurality of communication lines, a plurality of multiplexors, each multiplexor having at least two outputs, wherein each multiplexor is configured to receive a signal generated by the communications system via one of the plurality of communication lines, and each multiplexor may be selectably coupled to at least two of the devices in the strip of devices. The tester may be configured to index the plurality of communication lines to a first subset of the devices, initiate at least one test, command the devices to generate data for each of the at least one tests, retrieve data from a first set of the devices, and retrieve data from a second set of the devices.
A device, comprising:
A method of testing a plurality of devices, comprising:
Dependencies are inferred from the claim text.