US 9,285,419 B2 · Test probe alignment structures for radio-frequency test systems

Abstract

Electronic devices may be tested using a test station with a test fixture. The test fixture may include a first holding structure in which a device under test may be placed and a second holding structure for supporting test probes. The second holding structure may be mated with a test probe alignment structure during test station setup operations. The test probe alignment structure may include registration features configured to set the relative position of the first and second holding structures to a known configuration and may include test probe alignment features that can be used to correctly position the placement of the test probes. If at least one of the test probes is not sufficiently aligned to its corresponding alignment feature, the test probe alignment structures will not be able to engage properly with the second holding structure, and the position of the problematic test probe may be adjusted accordingly.

Claims10

Dependent claims

A method for configuring at least one test probe that is located at an adjustable position within a test fixture in a radio-frequency test station, comprising:

placing a test probe alignment structure into alignment with the test fixture;
and
while the test probe alignment structure and the test fixture are aligned, adjusting the position of the test probe with respect to the test fixture and the test probe alignment structure so that the test probe aligns with at least one corresponding test probe alignment feature in the test probe alignment structure, wherein adjusting the position of the test probe with respect to the test fixture and the test probe alignment structure so that the test probe aligns with at least one corresponding test probe alignment feature in the test probe alignment structure comprises moving the test probe horizontally within a test probe adjustment region, with respect to the test fixture and the test probe alignment structure, so that the test probe protrudes vertically into the at least one corresponding test probe alignment feature in the test probe alignment structure.

A method for determining whether a radio-frequency test probe is located at a proper position within a test fixture, wherein the test fixture includes registration features corresponding to registration features in a test probe alignment structure, comprising:

attempting to mate the test probe with a test probe alignment feature in the test probe alignment structure while mating the registration features of the test fixture with the registration features of the test probe alignment structure;
following an unsuccessful attempt at mating the test probe with the test probe alignment feature while mating the registration features of the test fixture with the registration features of the test probe alignment structure, adjusting where the test probe is positioned with respect to the test fixture and the test probe alignment structure;
following successful mating of the test probe with the test probe alignment feature while mating the registration features of the test fixture with the registration features of the test probe alignment structure, removing the test probe alignment structure from the test fixture;
inserting at least a given one of the registration features of the test fixture through an opening in a device under test;
and
while the given one of the registration features is within the opening of the device under test, testing the device under test using the radio-frequency test probe.

3 more elements

Dependencies are inferred from the claim text.

Test probe alignment structures for radio-frequency test systems

Life of this patent

Test probe alignment structures for radio-frequency test systems

Life of this patent

Abstract

Claims10