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US 9,285,414 B2Granted
Method and system for testing semiconductor device
AssigneeSK hynix Inc.
InventorsKie-Bong Ku, Lee-Bum Lee
Life of this patent
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Abstract
A method for testing a semiconductor device includes testing the semiconductor device in a plurality of operation modes sequentially, and programming the semiconductor device to operate in at least one of the operation modes when the semiconductor device passes the testing.
Claims4
A system for testing a semiconductor device, comprising:
- an operation result decider configured to test and determine whether the semiconductor satisfies a condition set for an operation mode of a plurality of operation modes based on an output of the semiconductor device;
- and
- a set information controller configured to receive a determination result of the operation result thereof, change set information based on the determination result of the operation result decider and transmit the set information to the semiconductor device,
- wherein the semiconductor device is configured to operate in at least one of the plurality of operation modes in response to the set information during a test operation.
1 more element
Dependencies are inferred from the claim text.