High speed, high current, closed loop load transient tester
AssigneeDialog Semiconductor GmbH
InventorMladen Veselic
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AssigneeDialog Semiconductor GmbH
InventorMladen Veselic
Estimating the term…
The present document relates to voltage regulators (101). In particular, the present document relates to the testing of voltage regulators subject to load transients. A test device (110) configured to generate a load current to be drawn at an output of a voltage regulator (101) is described. The test device (110) comprises a load connector (116) for coupling the test device (110) to the output of the voltage regulator (101); a transistor (113) configured to modulate the current through the load connector (116) subject to a control signal (123); wherein the current through the load connector (116) corresponds to the load current; a current sense resistor (112) arranged in series with the transistor (113) and configured to provide a feedback voltage (121) which is substantially proportional to the load current; and an operational amplifier (111) configured to generate the control signal (123) based on the feedback voltage (121) and based on a target voltage (122).
A test device configured to generate a load current to be drawn at an output of a voltage regulator, the test device comprising
Dependencies are inferred from the claim text.