Handler apparatus and test method
AssigneeAdvantest Corporation
InventorsHiroyuki Kikuchi, Mitsunori Aizawa
Life of this patent
Estimating the term…
Abstract
Provided is a handler apparatus which can connect devices under test to sockets of a test apparatus quickly and with low power consumption. The handler apparatus for conveying and connecting a plurality of devices under test to a plurality of sockets provided on a test head of a test apparatus, includes a position adjusting section that moves each of the plurality of devices under test on the test tray and adjusts the position thereof to a corresponding one of the plurality of sockets; and a device mounting section that mounts the plurality of devices under test whose positions have been adjusted by the position adjusting section, to the plurality of sockets.
Claims10
A handler apparatus for conveying and connecting a plurality of devices under test to a plurality of sockets provided on a test head of a test apparatus, the handler apparatus comprising:
- a position adjusting section that moves each of the plurality of devices under test on a test tray and adjusts the position of the device under test to a corresponding one of the plurality of sockets;
- a device mounting section that mounts the plurality of devices under test whose positions have been adjusted by the position adjusting section, to the plurality of sockets;
- a heating section to which the test tray mounting thereon the plurality of devices under test are loaded prior to undergoing a test;
- and
- a test section to which the test tray is loaded from the heating section, the test section being a space in which the plurality of devices under test are tested;
- wherein the position adjusting section adjusts the position of each device under test in the heating section.
A test method for testing a plurality of devices under test, comprising:
- moving each of the plurality of devices under test on a test tray;
- loading the test tray mounting thereon the plurality of devices under test into a heating section;
- adjusting the position of each of the plurality of devices under test to a corresponding one of a plurality of sockets while the test tray is in the heating section;
- loading the test tray from the heating section into a test section, the test section being a space in which the plurality of devices under test are tested;
- mounting the plurality of devices under test whose positions have been adjusted, to the plurality of sockets;
- and
- testing the plurality of devices under test having been mounted to the plurality of sockets.
Dependencies are inferred from the claim text.