A method, comprising the step of determining a displacement damage dose of a displacement damage dose device based on a characteristic curve of the displacement damage dose device, wherein an energy dependence of the displacement damage dose device response correlates with a nonionizing energy loss of the displacement damage dose device, wherein the displacement damage dose device comprises one or more sensors that are sensitive to displacement damage, wherein the device is configured to display a characteristic damage curve, and wherein the one or more sensors are comprised of one or more layers of semiconductor material, wherein the one or more layers of semiconductor material comprise an emitter layer and a base layer, wherein each of the one or more layers comprise one or more controls that affect the device performance and the device response to displacement damage, wherein the one or more controls comprise dopant species, doping level, polarity, and layer thickness.