Methods of forming wiring structures
AssigneeSamsung Electronics Co., Ltd.
InventorsJong-Min Baek, Sang-Ho Rha, Woo-Kyung You, Sang-Hoon Ahn, Nae-In Lee, Ki-Chul Kim, Jeon-Il Lee
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AssigneeSamsung Electronics Co., Ltd.
InventorsJong-Min Baek, Sang-Ho Rha, Woo-Kyung You, Sang-Hoon Ahn, Nae-In Lee, Ki-Chul Kim, Jeon-Il Lee
Estimating the term…
A wiring structure includes a first insulation layer, a plurality of wiring patterns, a protection layer pattern and a second insulation layer. The first insulation layer may be formed on a substrate. A plurality of wiring patterns may be formed on the first insulation layer, and each of the wiring patterns may include a metal layer pattern and a barrier layer pattern covering a sidewall and a bottom surface of the metal layer pattern. The protection layer pattern may cover a top surface of each of the wiring patterns and including a material having a high reactivity with respect to oxygen. The protection layer pattern may cover a top surface of each of the wiring patterns and including a material having a high reactivity with respect to oxygen.
A method of forming a wiring structure, the method comprising:
Dependencies are inferred from the claim text.