Methods and structures of integrated MEMS-CMOS devices
AssigneemCube Inc.
InventorsSudheer S. Sridharamurthy, Te-Hse Terrence Lee, Ali J. Rastegar, Mugurel Stancu, Xiao Charles Yang
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AssigneemCube Inc.
InventorsSudheer S. Sridharamurthy, Te-Hse Terrence Lee, Ali J. Rastegar, Mugurel Stancu, Xiao Charles Yang
Estimating the term…
A method for fabricating an integrated MEMS-CMOS device uses a micro-fabrication process that realizes moving mechanical structures (MEMS) on top of a conventional CMOS structure by bonding a mechanical structural wafer on top of the CMOS and etching the mechanical layer using plasma etching processes, such as Deep Reactive Ion Etching (DRIE). During etching of the mechanical layer, CMOS devices that are directly connected to the mechanical layer are exposed to plasma. This sometimes causes permanent damage to CMOS circuits and is termed Plasma Induced Damage (PID). Embodiments of the present invention presents methods and structures to prevent or reduce this PID and protect the underlying CMOS circuits by grounding and providing an alternate path for the CMOS circuits until the MEMS layer is completely etched.
A method for fabricating an integrated MEMS-CMOS device comprising:
A method for fabricating an integrated MEMS-CMOS device comprising:
Dependencies are inferred from the claim text.