US 9,244,126 B2 · Automated test system with event detection capability

Abstract

A test technique that may be implemented in an automated test system for testing semiconductor devices. The test technique may enable the fast detection of a signal transition, such as an edge, within a waveform and the timing of that event. Circuitry within a digital instrument that can be quickly and flexibly programmed may, at least in part, implement the test technique. That circuitry may be simply programmed with testing parameters, such that application of the technique may lead to faster test development and faster times. In operation, that circuitry receives parameters specifying parameters of a window over a waveform in which samples of the waveform will be taken to detect the signal transition. The circuitry may convert these parameters into control signals for other components in the test system, such as an edge generator or pin electronics, to take a programmed number of samples at desired times.

Claims29

Dependent claims

An automatic test system configured to collect a plurality of samples in a programmable window of a repetition of a repeated waveform, the automatic test system comprising:

a pin electronics circuit that, in response to an event in a timing signal at a first timing input, takes a sample of a value at a signal input to the pin electronics circuit;
and
a timing circuit having an output coupled to the first timing input of the pin electronics circuit, the timing circuit comprising:
a second timing input;
a programmable element;
an arithmetic circuit that computes an offset based at least in part on a value stored in the programmable element;
and
an output circuit, coupled to the output, that produces a signal with an event at a time determined based on an event in a signal at the second timing input and the computed offset,
wherein the value stored in the programmable element defines a number of increments within the programmable window at which samples are collected and/or a number of samples collected at each increment.

6 more elements

An instrument for an automated test system, the instrument configured for collecting a plurality of samples in a programmable window of a repetition of a repeated waveform, the instrument comprising:

a pin electronics circuit that samples a signal at a signal input to the instrument at a time specified by an event in a timing signal at a timing signal input;
and
a circuit coupled to the timing signal input, for generating the timing signal, the circuit comprising a triggering input and being configured to generate events in the timing signal corresponding to events in a signal at the triggering input, the circuit comprising:
an accumulator comprising at least a first input and a clock input, the accumulator increasing an accumulated value by an amount proportional to a value at the first input in response to an event at the clock input;
a first programmable register coupled to the first input of the accumulator;
a second programmable register;
and
a counter having inputs coupled to the second programmable register and the triggering input and an output coupled to the clock input of the accumulator, the counter configured to output an event on the output upon counting a number of events in a signal at the triggering input, the number being dictated by a value in the second programmable register, wherein the accumulator is coupled to the pin electronics circuit such that the accumulated value defines, at least in part, the timing signal.

5 more elements

Dependencies are inferred from the claim text.

Automated test system with event detection capability

Life of this patent

Automated test system with event detection capability

Life of this patent

Abstract

Claims29