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US 9,243,956 B2Granted
Automated multiple location sampling analysis system
AssigneeSciAps, Inc.
InventorDavid Day
Life of this patent
Estimating the term…
Abstract
An analysis system (e.g., LIBS) includes a laser source generating a laser beam, a movable optic configured to move said laser beam to multiple locations on a sample, and a spectrometer responsive to photons emitted by the sample at those locations and having an output. A controller is responsive to a trigger signal and is configured in a moving spot cycle to adjust the moveable optic, activate the laser source sequentially generating photons at multiple locations on the sample, and process the spectrometer output at each location.
Claims29
An analysis method comprising:
- adjusting a moveable optic in a moving spot cycle;
- activating a laser source emitting a beam striking the moveable optic creating a plasma generating photons at multiple locations on a sample;
- analyzing the photons at each location;
- and
- automatically terminating the moving spot cycle if the analysis of the photons indicates the sample is homogeneous.
2 more elements
An analysis method comprising:
- adjusting a moveable optic in a moving spot cycle;
- activating a laser source emitting a beam striking the moveable optic creating a plasma generating photons at multiple locations on a sample;
- analyzing the photons at each location;
- and
- automatically terminating the moving spot cycle, based on the analysis of the photons, when multiple concentration levels at multiple locations deviate by less than a predetermined percentage.
2 more elements
Dependencies are inferred from the claim text.