X-ray talbot interferometer and X-ray imaging system including talbot interferometer

An X-ray Talbot interferometer comprising:

• a first grating configured to diffract X-rays from an X-ray source and to form an interference pattern;
• a second grating configured to block a portion of X-rays that form the interference pattern;
• and
• a detector configured to detect X-rays from the second grating, wherein a property of an inspection object disposed between the X-ray source and the second grating is measured,
• wherein the second grating includes
• a first shield grating portion in which a shield portion and a transmissive portion are arranged periodically at a first period and
• a second shield grating portion in which a shield portion and a transmissive portion are arranged periodically at a second period, and
• the first period is expressed as follows:
• p
• ⁢
• ⁢
• s
• ×
• n
• ×
• Ls
• Ls
• +
• Lf
• where ps denotes a size of pixels that the detector has, n denotes a positive integer, Ls denotes a distance from the X-ray source to the first shield grating portion, and Lf denotes a distance from the first shield grating portion to the detector.