Active spectral control during spectrum synthesis
AssigneeCymer, Inc.
InventorsRostislav Rokitski, Nakgeuon Seong, Kevin O'Brien
Life of this patent
Estimating the term…
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AssigneeCymer, Inc.
InventorsRostislav Rokitski, Nakgeuon Seong, Kevin O'Brien
Estimating the term…
A spectral feature of a pulsed light beam produced by an optical source is estimated by modifying the wavelength of the pulsed light beam based on a predefined repeating pattern having a pattern period including a plurality of steps, the modification including shifting the wavelength of the pulsed light beam by a wavelength offset from a baseline wavelength for each step in the pattern period; measuring the wavelength of the light beam for each step in the pattern period as the wavelength is modified across the pattern; and estimating a spectral feature of the pulsed light beam over an evaluation window that includes all of the steps within the pattern period based at least in part on the measured wavelength of the light beam for each step in the pattern period.
A method of estimating a spectral feature of a pulsed light beam produced by an optical source, the method comprising:
A method of estimating a spectral feature of a pulsed light beam produced by an optical source, the method comprising:
Dependencies are inferred from the claim text.