Method for de-embedding in network analysis

A system for calculating one or more calibration phase connection element network parameters for one or more connection elements, comprising:

• first and second robes for probing printed circuit board trace for measuring one or more calibration phase system network parameters for a system comprising one or more measurement standards and one or more connection elements;
• first and second cables corresponding to the first and second probes;
• first and second ports of a measurement instrument corresponding to the first and second cables, the measurement instrument further comprising a processor, the processor performing the steps of:
• calculating a calibration phase system port impedance profile including an electrical length and a loss characteristic for each of the one or more system ports in accordance with at least the measured calibration phase system network parameters;
• generating a calibration phase connection element representative model of each of the one or more connection elements including electrical length and loss characteristic in accordance with at least the corresponding calculated calibration phase system port impedance profile;
• and
• calculating one or more calibration phase connection element network parameters of each of the one or more connection elements in accordance with each corresponding calibration phase connection element representative model and electrical length.

A system for calculating one or more device under test network parameters, comprising:

• first and second robes for probing printed circuit board trace;
• first and second cables corresponding to the first and second probes;
• first and second ports of a measurement instrument corresponding to the first and second cables, the measurement instrument further comprising a processor, the processor performing the steps of:
• in a calibration phase:
• measuring in accordance with the first and second probes one or more calibration phase system network parameters for a system comprising one or more measurement standards and one or more connection elements;
• calculating a calibration phase system port impedance profile including an electrical length and a loss characteristic for each of the one or more system ports in accordance with at least the measured calibration phase system network parameters;
• generating a calibration phase connection element representative model for each of the one or more connection elements including electrical length and loss characteristic in accordance with at least the corresponding calculated calibration phase system port impedance profile;
• and
• calculating one or more calibration phase connection element network parameters of each of the one or more connection elements in accordance with each corresponding calibration phase connection element representative model including the electrical length;
• wherein the calculation of the one or more calibration phase connection element network parameters of each of the one or more connection elements is performed by tuning the corresponding calibration phase connection element representative model such that one or more calculated calibration phase system network parameters with the effects of the connection elements removed match one or more predetermined standard network parameters;
• and
• in a measurement phase:
• measuring in accordance with the first and second probes one or more measurement phase system network parameters for a system comprising a device under test and one or more connection elements;
• and
• calculating one or more device under test network parameters by removing any effects of the one or more connection elements from the measurement phase system network parameters.